tantalum pentoxide

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网络五氧化二钽; 五氧化钽

Determination of 13 Trace Impurities in High-Purity Tantalum Pentoxide by ICP-AES
ICP-AES测定高纯氧化钽中13种杂质元素
XPS Analysis of Tantalum Pentoxide Thin Films Formed by Using Excimer UV Lamp
Excimer紫外灯辐照法钽氧化物膜XPS分析
The mechanism study of carbon reduction process of tantalum pentoxide
五氧化二钽碳还原过程的机理研究
A method in which the matrix was matched to calibration curve has been proposed for the direct determination of 13 trace impurities in high-purity tantalum pentoxide by ICP-AES.
本文提出了基体匹配校准曲线，ICP-AES法直接测定高纯氧化钽中13种杂质元素的分析方法，并考察了光谱干扰以及基体效应的影响，确定了仪器最佳工作条件。
Growth of Tantalum Pentoxide Films and Its Current Voltage Characteristics
五氧化二钽薄膜的制备及其I-U特性
Pretreatment Method for the Determination of Trace Fluoride, Chloride and Sulfate in Tantalum Pentoxide and Columbium Pentoxide by Ion Chromatography
离子色谱法测定五氧化二铌和五氧化二钽中痕量氟氯和硫酸根离子的前处理方法